[Precautions for test operation]
!

CAUTION
• Before starting test operation for system monitor, special function module monitor or ladder
monitor (bit device ON/OFF, word device present value changing, timer/counter set
value/present value changing, buffer memory present value changing), please read the manual
carefully to fully understand the operation methods.
For the devices that perform significant operations for the system, never perform test operation
to change data.
Doing so can cause accidents due to false outputs or malfunctions.

FX2N-64MR-001
Q2MEM-4MBF
MR-J2CN1
MR-J2S-70A
MR-JCCBL30M-H
Q172HBCBL5M-B
MR-E40AG
FX2N-64MS
FX3U-48MR/DS
GT05-MEM-1GC
FX3G-60MT/DSS
MR-DCL45K-4
MR-J2S-100B
AJ71ME81
MR-ENCBL10M-H
MR-RB60-4
MR-J2S-15KB4
HC-MFS13BD
MR-J2S-60A4
MR-PWS1CBL5M-A1-L
MR-J2CN1-A
A1SNMCA-8KP
MR-J3-60A
FX3U-16MT-DS
Q172HBCBL5M
MR-BKS1CBL5M-A2-H
QD81MEM-8GBC
FX-RAM-8
MR-J3-100A
MR-ESCBL5M-H
FX2NC-96MT
Q173J2B4CBL1M
FX3U-485ADP-MB
MR-J2HBUS1M-A
AJ65MBTL1N-16D
FX3UC-32MT-LT
GT1675M-STBA
A3NMCA-56
MR-RB34-4
HF-MP23
MR-PWS1CBL10M-A1-H
GT1675M-VTBD
FX3U-FLROM-64
MR-ENECBL2M-H
Q173J2B2CBL1M
MR-JHSCBL5M-H
MR-J3-700B
FX3U-64MR/ES-A
MR-J2S-700B4
FX3U-16MR/ES-A